EVENT

Project colloquium talk by Paolo Arcaini: "Decomposition-Based Approach for Model-Based Test Generation"

Date:

May 9 (Wed.)

Time:

16:30-18:00

Place:

ERATO MMSD Takebashi Site Common Room 3

Speaker:

Paolo Arcaini (National Institute of Informatics)

Title:

Decomposition-Based Approach for Model-Based Test Generation

Abstract:

Model-based test generation by model checking is a well-known testing technique that, however, suffers from the state explosion problem of model checking and it is, therefore, not always applicable. In this talk, I present an approach that addresses this issue by decomposing a system model into suitable subsystem models separately analyzable. The technique consists in decomposing that portion of a system model that is of interest for a given testing requirement, into a tree of subsystems by exploiting information on model variable dependency. The technique generates tests for the whole system model by merging tests built from those subsystems. Effectiveness and efficiency of the proposed decomposition-based test generation approach are measured both in terms of coverage and time.

*Everyone is welcome to join.